타이틀박스

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Product  |  PRODUCTS

※ STF has a different structure depending on the type and model of an IC to measure. / DUT (Device Under Test: Individual unit of measurement wafer
Type External STF Structure Features
Memory NAND - Size : 12”
- Ceramic : 10~20 layers
- Via : 500,000~2,000,000
- Fhin film : 1 layers
- DUT Density : Low
- DUT Number : High
- Touchdown : 1
DRAM - Size : 12”
- Ceramic : 20~25 layers
- Via : 1,000,000~2,000,000
- Fhin film : 2~4 layers
- DUT Density : High
- DUT Number : High
- Touchdown : 1~5
SystemIC SOC - Size : 2”~4”
- Ceramic : 50~80 layers
- Via : 500,000~1,000,000
- Fhin film : 2~5 layers
- DUT Density : Very high
- DUT Number : Low
- Touchdown : 200~500
SystemLSI CIS - Size : 5”~7”
- Ceramic : 43~96layers (internal electrode 60 layers till)
- Via : 160,000~1,600,000
- Fhin film : 1~5 layers
- DUT Density : Very high
- DUT Number : Low
- Touchdown : 10~30
- Low Power Noise